UC Berkeley

We present a versatile compact model for resistive random-access memory (RRAM) that can model different types of RRAM devices such as oxide-RRAM (OxRAM) and conducting-bridge-RRAM (CBRAM). The model unifies the switching mechanisms of these RRAMs into a single framework. We showcase the model's accuracy in reproducing published experimental device DC and transient characteristics of various RRAM structures. We also demonstrate the model's efficacy in capturing RRAM variability and conducting 1T1R circuit simulations.