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Impact of Oxidation Layer in the Resistive Switching Behavior of Nitride-Based Memristor Devices
- Zhang, Di;
- Dhall, Rohan;
- Song, Chengyu;
- Schneider, Matt;
- House, Stephen;
- Kunwar, Sundar;
- Dou, Hongyi;
- Cuccienco, Nick;
- Ciston, Jim;
- Watt, John;
- Kuo, Winson;
- Pettes, Michael;
- Wang, Haiyan;
- McCabe, Rodney;
- Chen, Aiping
Published Web Location
https://academic.oup.com/mam/article/30/Supplement_1/ozae044.783/7719575No data is associated with this publication.
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