Skip to main content
How Photoinduced Gate Screening and Leakage Currents Dynamically Change the Fermi Level in 2D Materials
- Volmer, Frank;
- Ersfeld, Manfred;
- Rathmann, Lars;
- Heithoff, Maximilian;
- Kotewitz, Luca;
- Lohmann, Mark;
- Yang, Bowen;
- Watanabe, Kenji;
- Taniguchi, Takashi;
- Bartels, Ludwig;
- Shi, Jing;
- Stampfer, Christoph;
- Beschoten, Bernd
Published Web Location
https://onlinelibrary.wiley.com/doi/full/10.1002/pssr.202000298No data is associated with this publication.
Many UC-authored scholarly publications are freely available on this site because of the UC's open access policies. Let us know how this access is important for you.