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How Photoinduced Gate Screening and Leakage Currents Dynamically Change the Fermi Level in 2D Materials

  • Author(s): Volmer, Frank;
  • Ersfeld, Manfred;
  • Rathmann, Lars;
  • Heithoff, Maximilian;
  • Kotewitz, Luca;
  • Lohmann, Mark;
  • Yang, Bowen;
  • Watanabe, Kenji;
  • Taniguchi, Takashi;
  • Bartels, Ludwig;
  • Shi, Jing;
  • Stampfer, Christoph;
  • Beschoten, Bernd
  • et al.

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