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How Photoinduced Gate Screening and Leakage Currents Dynamically Change the Fermi Level in 2D Materials

2020

Volmer, Frank;
Ersfeld, Manfred;
Rathmann, Lars;
Heithoff, Maximilian;
Kotewitz, Luca;
Lohmann, Mark;
Yang, Bowen;
Watanabe, Kenji;
Taniguchi, Takashi;
Bartels, Ludwig;
Shi, Jing;
Stampfer, Christoph;
Beschoten, Bernd
et al.

Published Web Location

https://onlinelibrary.wiley.com/doi/full/10.1002/pssr.202000298

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