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How Photoinduced Gate Screening and Leakage Currents Dynamically Change the Fermi Level in 2D Materials

  • Author(s): Volmer, Frank
  • Ersfeld, Manfred
  • Rathmann, Lars
  • Heithoff, Maximilian
  • Kotewitz, Luca
  • Lohmann, Mark
  • Yang, Bowen
  • Watanabe, Kenji
  • Taniguchi, Takashi
  • Bartels, Ludwig
  • Shi, Jing
  • Stampfer, Christoph
  • Beschoten, Bernd
  • et al.

Published Web Location

https://onlinelibrary.wiley.com/doi/full/10.1002/pssr.202000298
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