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Institute for Data Analysis and Visualization
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High-Quality Parallel Depth-of-Field Using Line Samples

2012

Tzeng, Stanley;
Patney, Anjul;
Davidson, Andrew;
Ebeida, Mohamed S.;
Mitchell, Scott A.;
Owens, John D.
Editor(s): Dachsbacher, Carsten;
Munkberg, Jacob;
Pantaleoni, Jacopo

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https://doi.org/10.2312/EGGH/HPG12/023-031

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