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High-Quality Parallel Depth-of-Field Using Line Samples
- Author(s): Tzeng, Stanley;
- Patney, Anjul;
- Davidson, Andrew;
- Ebeida, Mohamed S.;
- Mitchell, Scott A.;
- Owens, John D.
- Editor(s): Dachsbacher, Carsten;
- Munkberg, Jacob;
- Pantaleoni, Jacopo
- et al.
Published Web Location
https://doi.org/10.2312/EGGH/HPG12/023-031Main Content
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