Skip to main content
High-Quality Parallel Depth-of-Field Using Line Samples
- Author(s): Tzeng, Stanley
- Patney, Anjul
- Davidson, Andrew
- Ebeida, Mohamed S.
- Mitchell, Scott A.
- Owens, John D.
- Editor(s): Dachsbacher, Carsten
- Munkberg, Jacob
- Pantaleoni, Jacopo
- et al.