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Three-dimensional nanoscale characterisation of materials by atom probe tomography

  • Author(s): Devaraj, Arun
  • Perea, Daniel E
  • Liu, Jia
  • Gordon, Lyle M
  • Prosa, Ty J
  • Parikh, Pritesh
  • Diercks, David R
  • Meher, Subhashish
  • Kolli, R Prakash
  • Meng, Ying Shirley
  • Thevuthasan, Suntharampillai
  • et al.
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