- Main
Synthesis and electronic characterization of Nd2−xSrxNiO4 thin films (0≤x≤1.4)
- Taylor, Nicole K;
- Segedin, Dan Ferenc;
- Turkiewicz, Ari B;
- Zhang, Yang;
- Doyle, Spencer T;
- Pan, Grace A;
- Jiang, Haoyue;
- Bostwick, Aaron;
- Jozwiak, Chris;
- Rotenberg, Eli;
- Lanzara, Alessandra;
- Baggari, Ismail El;
- Brooks, Charles M;
- N'Diaye, Alpha T;
- Moreschini, Luca;
- Mundy, Julia A
Published Web Location
https://doi.org/10.1103/physrevmaterials.9.l032001Abstract
Layered nickelates have been studied extensively over the last three decades due to their structural similarities to the high-Tc superconducting cuprates. Using reactive oxide molecular beam epitaxy (MBE), we synthesize Nd2−xSrxNiO4 thin films for x=0−1.4 to probe the properties and electronic structure as a function of hole doping. The samples with lower doping show semiconducting behavior across the temperatures probed with an onset of metallic conductivity at x=1.4. We also present polarization-dependent O K and Ni L2,3 x-ray absorption spectra to track the evolution of the oxygen-nickel hybridization, distribution of holes between O 2p and Ni 3d states and the nickel oxidation state across the series. Angle-resolved photoemission spectroscopy (ARPES) measurements reveal a Fermi surface that comprises a cupratelike hole pocket of dx2−y2 character with an additional electron pocket of d3z2−r2 character at Γ. The emergence of a quasiparticle peak at the Fermi vector for x=1.4 corroborates the insulator-to-metal transition at x∼1. Finally, observe a fully two-dimensional Fermi surface with no momentum-dependent pseudogap, in contrast to measurements of the related bulk compound, Eu0.9Sr1.1NiO4.
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