- Main
Pattern-enhanced Resonant Soft X-ray Scattering for Operando monitoring of electrochemical solid-liquid interfaces
- Li, Haoyi;
- Andrle, Kas;
- Zhang, Qi;
- Cordova, Isvar A;
- Yang, Yao;
- Peng, Zhengxing;
- Yang, Feipeng;
- Freychet, Guillaume;
- Dhuey, Scott;
- Hexemer, Alexander;
- Helms, Brett A;
- Chao, Weilun;
- La Fontaine, Bruno;
- Ruiz, Ricardo;
- Guo, Jinghua;
- Yang, Wanli;
- Yano, Junko;
- Wang, Cheng
Published Web Location
https://doi.org/10.1038/s41467-026-69852-9Abstract
Unveiling interfaces at sub-nanometer scales is essential for advancing the understanding of complex chemical transformations. However, characterizing solid-liquid interfaces with high dimensional sensitivity and temporal resolution remains challenging, due to their dynamic nature and inaccessibility by conventional probes. Here we present an approach, Pattern-enhanced Resonant Soft X-ray Scattering, to overcome the challenges. Rooted in a “sample-as-optics” philosophy, this technique utilizes precisely engineered line-grating nanopatterns to modulate near-field X-ray illumination, coherently enhancing scattering signals from the line-gratings. We implement the method using Ni line-grating nanopatterns in electrochemical water oxidation. The periodic nanostructures serve as diffractive optical elements to reveal the Ni oxidation gradients and structural dynamics at the electrode-electrolyte interfaces. Finite-element simulations corroborate the observed trends by modeling variations in compositions and structures during electrocatalysis. Through integrating advanced sample design with coherent wave nature of soft X-rays, our approach opens accessible pathways to operando exploring chemical evolution and sub-nanometer dimensional variations simultaneously in electrochemical systems. This non-destructive method is efficient and element-specific, making it valuable for probing chemical and dimensional dynamics with appropriate modeling.
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