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Optical frequency-domain reflectometry (OFDR) using an integrated fiber tunable filter
Abstract
We present an all-fiber, compact device for optical frequency-domain reflectometry (OFDR). The device combines a Michelson interferometer with a fiber Fabry-Perot tunable filter for rapid wavelength scanning. The free spectral range of the filter is 32 nm and scans may be completed in less than 2.5 ms. Images of the surface geometry of the material under study can be reconstructed at scan rates up to 400 Hz with an axial resolution of 20 μm.
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