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Development of Silicon Drift Detectors for Strangeness Measurements
- Author(s): Odyniec, G.J.;
- Krieger, B.;
- Krofcheck, D.;
- Lewak, D.;
- O'Donnell, R.;
- Partlan, M.;
- Walton, J.T.;
- Wang, N.W.
- et al.
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