Skip to main content
Download PDF
- Main
Measurements of Single Event Upset in ATLAS IBL
- Balbi, G;
- Barbero, M;
- Beccherle, R;
- Bindi, M;
- Breugnon, P;
- Butti, P;
- Cinca, D;
- Dickinson, J;
- Ferrere, D;
- Fougeron, D;
- Garcia-Sciveres, M;
- Pascual, J Garcia;
- Gaudiello, A;
- Gemme, C;
- Giangiacomi, N;
- Hemperek, T;
- Jeanty, L;
- Kepka, O;
- Kocian, M;
- Lantzsch, K;
- Liu, P;
- Martin, C;
- Mekkaoui, A;
- Menouni, M;
- Potamianos, K;
- Rozanov, A;
- Takubo, Y;
- Wensing., M
- et al.
Published Web Location
https://doi.org/10.1088/1748-0221/15/06/p06023Abstract
Effects of Single Event Upsets (SEU) and Single Event Transients (SET) are studied in the FE-I4B chip of the innermost layer of the ATLAS pixel system. SEU/SET affect the FE-I4B Global Registers as well as the settings for the individual pixels, causing, among other things, occupancy losses, drops in the low voltage currents, noisy pixels, and silent pixels. Quantitative data analysis and simulations indicate that SET dominate over SEU on the load line of the memory. Operational issues and mitigation techniques are presented.
Main Content
For improved accessibility of PDF content, download the file to your device.
Enter the password to open this PDF file:
File name:
-
File size:
-
Title:
-
Author:
-
Subject:
-
Keywords:
-
Creation Date:
-
Modification Date:
-
Creator:
-
PDF Producer:
-
PDF Version:
-
Page Count:
-
Page Size:
-
Fast Web View:
-
Preparing document for printing…
0%