Investigation of defects and surface polarity in GaN using hot wet etching together with microscopy and diffraction techniques
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Investigation of defects and surface polarity in GaN using hot wet etching together with microscopy and diffraction techniques

  • Author(s): Visconti, P.;
  • Huang, D.;
  • Reshchikov, M.A.;
  • Yun, F.;
  • Cingolani, R.;
  • Smith, D.J.;
  • Jasinski, J.;
  • Swider, W.;
  • Liliental-Weber, Z.;
  • Morkoc, H.
  • et al.
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