Investigation of defects and surface polarity in GaN using hot wet etching together with microscopy and diffraction techniques
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Investigation of defects and surface polarity in GaN using hot wet etching together with microscopy and diffraction techniques

  • Author(s): Visconti, P.
  • Huang, D.
  • Reshchikov, M.A.
  • Yun, F.
  • Cingolani, R.
  • Smith, D.J.
  • Jasinski, J.
  • Swider, W.
  • Liliental-Weber, Z.
  • Morkoc, H.
  • et al.
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