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Extraction of highly charged ions from the electron beam ion trap at LBNL for applications in materials science and surface analysis
- Schenkel, T.;
- Kraemer, A.;
- Persaud, A.;
- McDonald, J.W.;
- Holder, J.P.;
- Hamza, A.V.;
- Leung, K.N.;
- Schneider, D.
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