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X-ray characterization of oxide-based magnetic semiconductors

  • Author(s): Idzerda, Y.U.
  • Lussier, A.
  • Dvorak, J.
  • McClure, A.
  • Liberati, M.
  • Holroyd, J.
  • Arenholz, E.
  • Shinde, S.R.
  • Ogale, S.B.
  • Venkatesan, T.
  • et al.
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