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An ultrafast x-ray detecting system at an elliptically polarization undulator beamline

  • Author(s): Feng, J.
  • Comin, A.
  • Bartelt, A.F.
  • Shin, H.J.
  • Nasiatka, J.R.
  • Padmore, H.A.
  • Young, A.T.
  • Scholl, A.
  • et al.
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