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Determination of buried interface composition and magnetism profiles using standing-wave excited soft x-ray emission and inelastic scattering
- Author(s): Sell, B.C.;
- Ritchey, S.B.;
- Yang, S.-H.;
- Parkin, S.S.P.;
- Watanabe, M.;
- Mun, B.S.;
- Plucinski, L.;
- Mannella, N.;
- Nambu, A.;
- Guo, J.;
- West, M.W.;
- Salmassi, F.;
- Kortright, J.B.;
- Fadley, C.S.
- et al.
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