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Intermixing at the In x S y /Cu2ZnSn(S,Se)4 Heterojunction and Its Impact on the Chemical and Electronic Interface Structure
- Hauschild, D;
- Mezher, M;
- Schnabel, T;
- Spiering, S;
- Kogler, W;
- Carter, J;
- Blum, M;
- Yang, W;
- Ahlswede, E;
- Heske, C;
- Weinhardt, L
Published Web Location
https://doi.org/10.1021/acsaem.9b00263Abstract
We report on the chemical and electronic structure of the interface between a thermally co-evaporated In x S y buffer and a Cu2ZnSn(S,Se)4 (CZTSSe) absorber for thin-film solar cells. To date, such cells have achieved energy conversion efficiencies up to 8.6%. Using surface-sensitive X-ray and UV photoelectron spectroscopy, combined with inverse photoemission and bulk-sensitive soft X-ray emission spectroscopy, we find a complex character of the buffer layer. It includes oxygen, as well as selenium and copper that diffused from the absorber into the In x S y buffer, exhibits an electronic band gap of 2.50 ± 0.18 eV at the surface, and leads to a small cliff in the conduction band alignment at the In x S y /CZTSSe interface. After an efficiency-increasing annealing step at 180 °C in nitrogen atmosphere, additional selenium diffusion leads to a reduced band gap at the buffer layer surface (2.28 ± 0.18 eV).
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