Lawrence Berkeley National Laboratory

We experimentally evaluate the performance of a novel pixelated diamond sensor for non-invasive x-ray beam monitoring in the tender x-ray regime (6–30 keV). Through simulations and experiments, we assess its precision in measuring beam parameters (flux, position and size) and compare it to a scintillator re-imaging microscope, an established, invasive photon beam diagnostic. Experimental results for the pixelated diamond sensor show a position sensitivity better than 50μm-rms (on the order of the pixel size), up to >100Hz feedback rates, and accurate beam size tracking. The pixelated diamond sensor, though less precise than a scintillator reimaging microscope, offers the advantage of being non-invasive and has been successfully integrated into automated alignment routines using EPICS/Bluesky instrument control framework.