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Open Access Publications from the University of California

Changes in Electronic Device Properties During the Formation of Dislocations

  • Author(s): Ross, F.M.;
  • Hull, R.;
  • Bahnck, D.;
  • Bean, J.C.;
  • Peticolas, L.J.;
  • Kola, R.R.;
  • King, C.A.
  • et al.
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