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Local and transient nanoscale strain mapping during in situ deformation

  • Author(s): Gammer, C
  • Kacher, J
  • Czarnik, C
  • Warren, OL
  • Ciston, J
  • Minor, AM
  • et al.

Published Web Location

https://doi.org/10.1063/1.4961683
Abstract

The mobility of defects such as dislocations controls the mechanical properties of metals. This mobility is determined both by the characteristics of the defect and the material, as well as the local stress and strain applied to the defect. Therefore, the knowledge of the stress and strain during deformation at the scale of defects is important for understanding fundamental deformation mechanisms. Here, we demonstrate a method of measuring local stresses and strains during continuous in situ deformation with a resolution of a few nanometers using nanodiffraction strain mapping. Our results demonstrate how large multidimensional data sets captured with high speed electron detectors can be analyzed in multiple ways after an in situ TEM experiment, opening the door for true multimodal analysis from a single electron scattering experiment.

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